jasco
V-670
10년
주장비
시험
기계가공·시험장비 > 달리 분류되지 않는 기계가공 시험장비 >
2013-04-15
83,500,000원
고정형
건별
0원
할로겐 램프 검출기 등
최근 건축재료 분야에서 핫이슈가 되고 있는 단열필름 차열도료 열반사단열재 및 스마트윈도우 등에 대하여 UV 및 IR을 이용 반사율 및 차폐율을 측정하는 장비
1) Optical system : Single monochromator Dual grating Dual detector
UV/VIS region : 1200 lines/mm plane grating
NIR region : 300 lines/mm plane grating
Czerny-Turner mount Double beam type
2) Light source : Deuterium lamp : 190 to 350 nm
Halogen lamp : 330 to 2700nm (3200nm option)
3) Light source exchange wavelength : User-selectable within a range of 330 to 350nm
4) Detector : Photomultiplier Tube (PMT) Peltier cooled PbS detector
5) Wavelength range : 190 ~ 2700nm
190~3200nm is factory option
6) Wavelength Accuracy : ± 0.3 nm (Using a spectral bandwidth of 0.5nm ; UV/VIS region ; stabilized room temperature)
± 1.5 nm (Using a spectral bandwidth of 2.0nm ; NIR region ; stabilized room temperature)
7) Wavelength repeatablbility : ±0.05 nm(UV/VIS bandwidth 0.5nm)
8) Scan speed : 10 - 4000 nm/min (8000nm/min in preview mode)
9) Slew speed : 12000nm/min(UV/VIS Region)
10) Spectral Bandwidth : 0.1 0.2 0.5 1 2 5 10nm (UV/VIS Region)
L2 L5 L10nm (low stray-light mode)
M1M2 nm(micro-cell mode)
0.4 0.8 1 2 4 8 20 40nm (NIR Region)
L8 L20 L40nm (low stray-light mode NIR Region)
M4M8 nm(micro-cell mode NIR Region)
11) Photometric Range : -2 ~ 4 Abs(UV/VIS Region)
-2 ~ 3 Abs(NIR Region)
0 to 10000%T
12) PhotometricAccuracy : ± 0.002 Abs (0 to 0.5 Abs)
± 0.003 Abs (0.5 to 1 Abs)
± 0.3 %T (Tested with NIST SRM 930D)
13) Photometric repeatablbility : ±0.001 Abs (0 to 0.5 Abs)
14) Stray Light : 1% (198nm KCl 12g/L aqueous solution)
0.005 % (220 nm NaI 10g/L aqueous solution)
0.005 % (340 nm NaNO2 50g/L aqueous solution)
0.005 % (370 nm NaNO2 50g/L aqueous solution)
(spectral bandwidth : L2nm 10mm cell)
0.04% (1690nm H2O 10mm cell)
0.1% (1690nm CH2Br2 50mm cell)
(spectral bandwidth : L8nm)
16) BaselineStability : ± 0.0003 Abs/hr(Value obtained grater than two hours after turning on the light source ; stabilized room temperature : 250nm ; reponse:slow ; spectral bandwidth : 2nm)
17) Baselineflatness : ± 0.0005 Abs
(Value obtained after instrument baseline correction with a temperature variation of less than 5℃ ; wavelength range: 200 to 850nm : response : midium spectral bandwidth : 2nm ; scan speed : 400nm/min; Spectral bandwidth : 8nm for wavelength range 850 to 2500nm [Based on JAIMA standard JAIMAS-0001])
18) RMSNoise : 0.00003Abs
(0 Abs; wavelength : 500nm; measurement time 60sec reponse: medium ; bagwidth : 2nm)
19) Software : Spectra Manager II
① Measurement mode : Quantitative analysis Wavelength scan (Abs%T%RSamplereferance) Time scan(Abs%T%RSamplereferance) Fixed wavelength(Up to 8wavelength) Abs/%T monitor
② Data processing : Peak picking Peak height Peak area Peak width Derivative Smoothing Data truncation Arithmetric Baseline correction Substraction Deconvolution Vertical-Horizontal axis conversion Horizontal axis conversion
③ Other standard function : Validation software Enzyme activity calculation Film thickness measurement Color analysis