Panalytical
Empyrean
5년
주장비
시험
화합물 전처리·분석장비 > 분광분석장비 > X-선회절분석기
2022-03-18
364,079,298원
기관의뢰
고정형
건별
200,000원
해당 엑스선 회절 분석기 장비는 인공지능 학습에 요구되는 수준의 데이터 규모를 생성하기 위한 고성능의 자동화된 물성 평가 장비이며, 향후 시편 제작 자동화 및 인공지능 서비스 플랫폼 구축을 위해 사용될 예정임.
1. X-Ray Generator
(1) Max Power : 4 kW or higher
(2) X-Ray tube anode : Cu
(3) Max Voltage, Current : 45 kV, 60 mA or higher
2. High Precision Goniometer
(1) Geometry : θ-θ with horizontal sample mounting
(2) Radius : 240 mm or longer
(3) Driving method : Servo motor drives
(4) Min. step size : 0.0001°or less
(5) Automatic recognition for all X-ray optic modules
- All optics should be recognized by sensor and displayed a current status on a control Software.
3. Sample Stage
(1) Reflection-Transmission Stage
- Sample rotation : Control a speed by software.
(2) Automatic sample changer : Max 48 positions or more
(3) Sample Holder
- Reflection holder : 30ea or more
- Glass holder : 50ea or more
- Si Zero background holder(32mm) : 15ea or more
(4) Multi axes Stage
- All axes should be controlled by Software
- Chi range : -3 ~ 93° or wider
- Phi range : 2 x 360°or wider
- Z range : 2 mm or wider
- Wafer holder or equivalence
- Magnetic sample holder or equivalence
- Dial gage or equivalence
- Beam knife or equivalence
(5) High Temperature Stage
- Temp. range : room temp ~ 1200 ℃ or wider
- Dynamic height correction with motorized Z axis.
- Cermic sample cup diameter : 16 mm or bigger
4. Multi-purpose Incidence optics
(1) Software control and motor drive type
(2) Multi layer mirror : Divergence & parallel beam
- Energy resolution : 450 eV or less
(3) Automatic slit set or equivalence
(4) Automatic mask set or equivalence
(5) Automatic beam attenuator
(6) Soller Slit : 0.04 rad or less
5. Multi-purpose Diffraction optics
(1) Software control and motor drive type
(2) Parallel plate collimator : 0.2°/ 0.5°or more
(3) Automatic anti scatter slit or equivalence
(4) Soller slit : 0.02 / 0.04 rad or more
6. Detector
(1) High speed Solid State 2D detector
- Pixel number : 65,536 or more
- Pixel size : 100 um or less
- Global count rate : 3.0 x 1010 CPS or higher
- Mode : 0D, 1D, 2D should be changed by software
7. Analysis Software
(1) Qualitative and Quantitative Analysis : 3 license or more
- Auto peak search
- Simultaneous analysis for multiple patterns
- Quantitative analysis using Reference peak intensity
- Rietveld refinement
- Automatic Rietveld analysis should be supported.
- Report creation
- ICDD PDF-2 database (5years, 1 license) or more
(2) Thin film analysis: 3 license or more
- Rocking curve analysis
- XRR analysis : Fitting and Simulation
(3) Stress analysis : 3 license or more
(4) Texture analysis : 3 license or more
8. System Control/Data system
(1) OS : Windows 10 Pro
(2) Memory : 8 GB or more
(3) SSD : 256 GB or more
(4) 23inch dual monitor or more
9. Accessory
(1) Chiller system
(2) AVR system : 10 KVA or equivalent
(3) PC table and chair