Bruker Nano Surface Business
DMFS-PKG+ICON
5년
주장비
분석
광학·전자 영상장비 > 현미경 > 주사탐침현미경
2022-01-26
380,886,264원
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기관의뢰
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30,000원
일반 주사탐침현미경의 문제점인 느린 측정속도를 해결하여 최대 100배 빠른 측정 속도로 데이터 분석 가능
- 200mm 이상의 큰 시료에 대해 비파괴 분석 가능
- 주사탐침현미경의 탐침과 시료의 표면에 측정되는 힘을 이용하여 시료 표면의 adhesion, modulus를 정량적인 수치로 측정하여 시료 표면의 나노 수준의 특정 부분 성분을 확인
1. 주장비(Main body)
(1) SPM Base
1) Tip-scanning area for 210mm diameter sample or more
2) Imaging noise level : 0.4 Å RMS or less
3) Vertical resolution : 0.01nm or less
4) Lateral resolution : 0.1nm or less
5) Tip Engage is automated, and fully software controlled
6) Nano-mechanical property mapping with High Speed Topography (20Hz or more)
7) Modulus, adhesion and deformation while simultaneouslyimaging topography
8) Range: 1 MPa to 70 GPa or more
9) High Speed image with Nano-mechanical Property mapping
10) Property Mapping Mode : Height, Modulus, Adhesion,Stiffness, Elasticity at high resolution (<10nm) ) or less
11)Nano Mechanical Property Mapping speed : <10 minutes per image with Large Scan Scanner
(2) Ultra Speed Scanner
1) Scan size X,Y and Z for Ultrahigh-Speed : 30 μm X 30 μm X 3 μm or more
2) Scanning at 100X faster than general scanner while maintaining image quality and at > 125 Hz without scanner ringing or more
3) Automated laser and detector alignment.
4) Closed-loop XY noise : < 0.20 nm RMS, in typical imaging bandwidth (2.5 kHz). or less
5) Z sensor noise : < 40 pm RMS, in typical imaging bandwidth (625Hz) or less.
(3) Large Scan Scanner
1) Scan size X,Y and Z : 80 μm X 80 μm X 10 μm or more
2) Scanner is able to operate in open-loop and closed-loop in XY and Z.
3) Vertical noise floor : 30pm RMS or less
4) TrackScan optical lever position detection : 1 channels or more
(4) Fluid Imaging Holder
1) Cantilever holder for fluid operation
2) Fluid operation : contact mode, TappingMode, PeakForce Tapping or Non-contact AFM with PLL, Auto Imaging and Nano Mechanical. Also does Force Modulation when used with Z Modulation.