Perkin Elmer
NexION® 2000B ICP-MS
9년
주장비
분석
화합물 전처리·분석장비 > 질량분석장비 > 달리 분류되지 않는 질량분석장비
2019-08-05
273,548,340원
기관의뢰
고정형
일별
90,000원
1. The ICP-MS system was designed for rapid, routine trace element analysis of a wide variety for materials.
2. Specially designed software running under Microsoft Windows makes the system easy to use and because of its familiar operating environment it is required to user training. A true preemptive multitasking software was developed as a 32-bit application exclusively for ICP-MS.
3. Quadrupole Ion Deflector, binary-gold-metalized ceramic quadrupole spectrometer technology and revolutionary Universal Cell Technique assures high performance.
4. The detection systems is a dual stage discrete electron multiplier, both analog and pulse signals are automatically measured simultaneously, every time a scan is made.
5. Sample management system of the Separations Module provides independently addressable vial carousels that give you the flexibility for multiple separation methods, multiple operator use and more convenient sample preparation.
○ Autosampler
- Integrated or Free standing autosampler(w/Round or Three axis trays)
- 5 ~ 15mL Vessels apply
○ Sample introduction system
- Peristaltic pump, Nebulizer, Spray chamber
○ Plasma generator
○ Cone interface
- Double or Triple cone interface
- Sampler cone: ≥1.0mm Ni
- Skimmer cone: ≥0.4mm Ni
○ Vacuum system
- Turbo molecular pump: dual inlet ≤1×10-6 mbar
○ Detector
- Dual-mode detector
○ Quadruple mass analyzer
- Mass range: ~ 260u
- Detection limit: 9Be < 0.5 ppt, 115In < 0.25 ppt
- Sensitivity: 238U > 40 M cps/mg/L
- Oxide and Doubly charged: CeO/Ce < 2.5%, Ce2+/Ce < 3%
- Quadruple scan speed: > 5000 amu/sec