Malvern Panalytical
Empyrean
10년
주장비
분석
광학·전자 영상장비 > 방사선발생/측정장비 > X-선발생기
2019-04-29
269,850,770원
기관의뢰
고정형
시간별
[Hr] 40,000원
- 본 장비는 분말, 벌크 및 박막 시료에 대한 정성/정량적 분석을 위한 장비임
- 일반 분말, 박막, 결정 구조적 특성, 구조정보 분석과 같은 여러 가지 어플리케이션으로 활용
- 극미량 시료 및 불순물 분석 등의 고수준 난시료 평가 분석
1. Main Body (Includes enclosure, platform, tube shield)
1) X-ray Generator
(1) Max. output : 4kW
2) X-ray tube
(Tube target is Cu fine focus and shield or Rotating target)
3) High precision Goniometer
(1) Geometry : θ/θ or θ/2θ geometry with horizontal sample mounting
(2) Radius : 240mm or longer
(3) Minimum step size : 0.0001° or less
(4) Driving method : Servo motor drives or Stepping motor drives
2. Sample Stages and plate
1) 3-axes moving cradle
- Z range : 10 mm or wider
- wafer sample holder
2) Basic sample stage
3. Incident Beam Optics
- Automatic Beam attenuator
4. Diffracted Beam Optics
- It system includes Two beam paths.
1) Long soller slit or equivalent
(1) Equatorial acceptance : 0.5o or less
(2) Combined with Soller slit : 2.5o or less
2) Anti-Scatter Silt
(1) Automatic variable type or Fixed type
5. Detectors
1) 0D, 1D high speed Solid State detector
(1) Pixel strip number : 256 or bigger
6. Analytical softwares
1) operation software
(1) Measurement control
(2) Manual measurement and standard measurement
(3) Including Data explorer adds-on.
(4) On-line display of analysis process and data
(5) Easy data sharing, exporting/importing
2) Software for Qualitative and Quantitative Analysis
(1) Phase analysis
- Automatic peak search(including multiple peak separation)
- Basic data processing : Smoothing, background removal and Ka2 removal
- Calculation of line position, center of gravity integrated area, half width
- 3D display and overlay of several diagrams
- Crystallinity % display, Data smoothing and quantitative analysis
(2) Crystallographic Analysis & Rietveld Analysis
- Unit cell refinement ( HKL file fit) to work with phases of unknown structures
- Space Group testing : Peal only and Full profile Le Bail fit
- 6 profile functions, Charge Flipping
- Simultaneous quantitative analysis, lattice parameter, refinement, crystallite size determination & micro strain analysis
- Structure plotting : image shifting, turning axis, rolled or zooming, 3D Fourier maps