1. Model : JEM-ARM300F STEM Cs(FHP Option)
    Oneview Camera system (In-situ option포함)
           965 Quantum ER(EELS System)
2. JEOL의 Dual EDS System(100mm2)
   Dual EDS용 Special Double tilt holder포함
3. 160kV, 60kV Cs Alignment
4. Remote control System
5. Tomography

Basic Performance:
1. Resolution
TEM Point image: 0.18 nm
TEM Lattice image: 0.05 nm
STEM BF image: 0.063 nm
STEM DF image: 0.063 nm
2. Accelerating Voltage: 80 to 300KV
Step size: 100 V
Cs corrector tuning: 300kV, 80 kV (160, 60 kV optional)
3. Electron Gun
Emitter: W Cold field emission type
Brightness: ≥ 1 x 109 A/㎠/sr(at 300kV) : CFEG
Vacuum pressure: Order of 10-9 Pa : CFEG
Probe current: 0.5 nA for 0.2 nm probe diameter
Energy resolution: 0.35 eV : CFEG
4. Power Stability
Acc. Voltage: 0.4 x 10-6 /min
OL current: 0.5 x 10-6 /min
5. Objective lens constant(illumination/imaging)
Focal length : 2.1 mm / 2.2 mm
Cs coefficient : 0.7 mm / 0.7 mm
Cc coefficient : 1.3 mm / 1.3 mm
Minimum focal step : 0.3 nm / 0.3 nm
6. Spot size: min. 0.10 nm dia.
7. CB Diffraction
Convergence angle : 1.5 - 100 mrad or more
Acceptance angle : ± 10˚
8. Magnification
MAG : x2,000 ~ 2,000,000
LOWMAG : x60 ~ 40,000
SAMAG : x8,000 ~ 1,000,000
9. Camera length
SA DIFF mode : 8 ~ 150 Cm
10. Specimen tilting X/Y : ± 24˚ / ± 28˚
11. EDS Solid angle : 0.47 sr.
12. Take-off angle : 16˚
13. GIF system : Dual EELS