Rigaku
SmartLab
10년
주장비
시험
물리적 측정장비 > 길이/위치측정장비 > 달리 분류되지 않는 길이/위치측정장비
2015-04-01
281,067,662원
고정형
건별
50,000원
rocking curve, theta-2theta cureve: Measurements of crystal orientation, lattice parameters
Reciprocal mapping: Analysis of strained or relaxed thin films, in -plane parameters
Reflectivity measurement: Film thickness, roughness, mixing of films, etc
3kW x-ray tube with Cu target
Parallel beam optics using Gobel mirror with the angle of acceptance 1°
4 bounce Ge 022 channel cut monochromator with a resolution < 12 arcsec
Computer controlled Eulerian cradle: x, y, z tralslation, rotation
5" vacuum chuck for sample mounting
2 bounce Ge 022 channel cut or LiF analyzer crystal
Computer controlled diffractometer with a 0.0001°resolution
NaI scintillation counter with maximum count rate 1000000cps
Analysis software including reflectivity simulation, FFT calculation, etc.