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SNE-4500M
11년
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광학·전자 영상장비 > 현미경 > 주사전자현미경
2012-09-13
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A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface topography, composition, and other properties such as electrical conductivity.
텅스텐 SEM, 나노패턴 300nm 이상 Normal View 가능하나 단면 View 측정에는 숙련도가 필요함.
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