파크시스템즈
XE-100
10년
주장비
분석
광학·전자 영상장비 > 현미경 > 달리 분류되지 않는 현미경
2012-06-21
98,000,000원
고정형
기타
원
탐침과 시료 간의 인력 또는 척력을 측정
A. Feature 1. Microscopic morphology analysis of sample surface in ambient environment. 2. Three dimensional atomic resolution surface imaging capability. 3. Distortion free image by hardware closed-loop feedback scan positioning system. 4. System consists of SPM microscope stage with the Contact AFM, Dynamic Force AFM, LFM, Phase Imaging, Force vs. Distance curve, and Scanner, Control system and Software. B. System component 1. Complete Atomic Force Microscope System AFM controller and Data acquisition system X,Y (<90um) scanner with closed-loop feedback control Scanning (>7.5um) Z head (>5 mm x >5 mm) X,Y manual micrometer Upright High power optical microscope (Digital CCD camera) AFM Data acquisition software AFM Image processing software Real-Time image display for CCD camera 2. Vibration Isolation system 3. Enhance Acoustic Enclosure with steel frame 4. Variable Cantilevers