선우테크
ASKP200200
5년
주장비
분석
전기·전자장비 > 측정시험장비 > 달리 분류되지 않는 측정시험장비
2012-05-02
267,053,311원
고정형
55,636원
○ 주요사양(1) Tip diameter : 20, 10, 2 mm and 50 microns supplied(2) Work function resolution : 1-3mev (2mm tip), 5-10mev(50micron tip, assuming optical table support)(3) Scanning system : 200x200mm(4) Height control : 25mm (1 inch) Automatic(5) Position resolution: 7 microns (X,Y), 2 microns (Z)(6) Tracking system : Automatic hold of Tip-to-sample distance to 0.4 microns(7) Visualization : 3D maps of surface potential and sample topography(8) Optical system : colour camera with zoom lens and optical mounts, together with dedicated 7 inch TFT display and PC(9) PC : 19 inch TFT display, pre-installed system software(10) Digital TFT Oscilloscope : Included(11) Reference sample : Aluminium/Gold test sample included(12) Faraday cage : 450x450x480mm with fast entry door(13) Spare tip amplifier : included(14) Digital control : Tip amplitude, Frequency, Mean spacing, Potential(15) Averaging : Signal, work function and SPV averaging(16) Detection system : Off-null with parasitic capacity rejection(17) Software features : Digital control of all kelvin probe parameters Simple set-up procedure for signal optimization Fast measurement mode for tracking real time work function changes. 1000 work function points/min at ∼20mev resolution. Variable scan size and real time 3D charting of sample WF. Export of data to scientific analysis software.(18) SPS wavelength range : 400-1000nm(19) SPS light source : HIQ tungsten halogen light(20) Full-width Half-maximum : 35-70nm(21) Wavelength selector : automatic
○ 특징 (1) This system is non-contact, non-destructive vibrating capacitor device used to measure the work function of conducting materials or surface potential of semiconductor for solar cell applications (2) The larger scanning stages are able to accommodate large up to 8 inchs or small samples with incredible accuracy giving the user the opportunity to perform sample scans of up to 200x200mm (3) Voice coil driver provides very high rejection of driver talkover noise compared with piezoelectric systems (4) Off null signal detection system for vastly improved resolution (5) Height regulation feature to control the tip to sample spacing during measurements and scans which allow for stable, reliable and repeatable results○ 구성 및 성능(1) Scanning Kelvin Probe 시스템(2) CV Profile Data Analysis 시스템