(주)파크시스템스
SPM(XE-120)
5년
주장비
분석
기타 > >
2006-02-21
110,000,000원
고정형
22,917원
1. Microscopic morphology analysis of sample surface in ambient environment.2. Three dimensional atomic resolution surface imaging capability.3. Distortion free image by hardware closed-loop feedback scan positioning system.4. Distortion free scan by separating z scanner from x-y scanner.5. System consists of SPM microscope stage with the Contact AFM, Tapping AFM, Non-contact AFM, LFM, MFM, STM, Phase Imaging, Force Modulation, EFM,DC-EFM (EFMM), SKPM, SMSM, Force vs. Distance curve, SSRM, Current Image, I/V Spectroscopy, Open Liquid operation and Scanner, Control system and Software
원자현미경은 마이크로머시닝(Micromachining)으로 제작된 극히 미세한 탐침을 시료표면 가까이 가져갔을 때 생기는 원자간의 상호 작용력을 측정함으로써 시료표면의 3 차원적 형상을 알아내는 장치