㈜정남시스템
JN-TE-01
5년
주장비
시험
기타 > >
2010-04-23
362,220,000원
고정형
75,463원
o Main instrument with signal controller and connector - Period : 200us to 10s in 1-2-5 sequence - Pulse Amplitude : 0V to 13V - Pulse Width : 1us to 1s - DC Bias : -13V to +13V - Output Current : ~30mA - Trap profiling : double correlation method - Test signal : 1Mhz, 100mV rms - Full range settings : 10pf to 1000pf in 1-3-10 sequence - Response Time : 3 microseconds - DC leakge current tolerance : 150 microampers - Output Level : +/-5VFS - Pre-amp Gain : 1 - 300 in 1-3-10 sequence - Rate windows : 3 sec-1 to 1.5E4 sec-1 in 1-2-5 sequence - Filter time constants : 1, 3 and 10 sec - DC Rejection : Automatic suppression of background capacitance to more than 60dB - Trigger Input : allows triggering of correlator with external accessory - Sensitivity: Delta C/C ~ 1E-6, Nt ~ 3E-6(Nd-Na) - DC leakage current : 150 micro amperes - Narrow filling pulses : < 100 nanoseconds using external pulse generator - Current Transient : semi-insulating materials, FETs and HEMTs - Charge Transient : Organic polymers - Recording : four or more simultaneous - Determination : single temperature scan - Analysis interfaces : feedback loop - C-V plotting : external biaso Closed cycle sample stage with cryostat system - Temperature controller with RS232 & GPIB interface - Cryostat-controller cable - Temperature range : 77-500K - 0.75" diameter Sapphire disk sample base - Two tungsten probes installed in electrically isolated probe holders - Temperature sensor : Two silicon diodes, one for control, one for measurement - Quartz windows: 1.63" diameterso Data processor & Analysis S/W - Data system : 2.8GHZ, 256MB SDRAM, 80GB HDD, XP - 16-bit ADC/12-bit DAC plug-in card & shield cable - GPIB plug-in card & shielded cable - Coaxial cables - Adapter Modules - Application S/W in LabView for measurement, control and analysis o Optional System - Current Transient Spectroscopy(CTS) -External control and connections : on/off, Input/Out/put -BNC's Sensitivity : 1x10E + 4 V/A -Out
- This Instruments is powerful tool for the study of electrically active defects in multi-layer.- The technique is an extremely versatile technique for the determination of virtually all parameters associated with traps including density, thermal cross selection, energy level and special profile.- Digital read-out of leakage current during temperature sweep.- External signal input allows analysis of transients other than capacitance such as current or charge.- Fast responding capacitance meter 3 microseconds response time.- Used for trap profiling with the double correlation method.- Simultaneous recording of four or more spectra at different rate windows and thus determination of all trap signatures in a single temperature scan.- Rapid recovery from strong overload conditions e.g., 20mA injection current.- Secondary correlator used for generating two spectra with different rate windows in a single temperature sweep.- Trigger input allows triggering of correlator with external accessories.