1. Instrument Specification 1) Available measurements (1) Lifetime (2) Resistivity (3) Emitter saturation current density. (4) Trap density (5) One-sun Voc 2) Lifetime measurement range (1) 100ns to greater than 10ms 3) Measurement (analysis) modes (1) QSSPC, transient, and generalized lifetime analysis 4) Resistivity measurement range (1) 3-600 (undoped) 0hms/sq. 5) Available light bias range (1) 0-50 suns 6) Typical calibrated injection range (1) 10^13-10^16cm^-3 7) Available spectrum (1) white-light and IR illumination 8) Sensor area (1) 40-mm diameter 9) Sample size, standard configuration (1) Standard diameter : 40-210mm (2) Smaller sized may be measured 10) Wafer thickness range (1) 10-2000μm(calibrated) (2) Other thicknesses may be measured 11) Warranty (1) One-year limited warranty on all parts and software (2) Service agreement also available