Aixtron
AIX2600G3
10년
주장비
시험
기계가공·시험장비 > 반도체장비 > 달리 분류되지 않는 반도체장비
2005-11-16
1,529,451,020원
기관의뢰 직접사용
고정형
시간별
280,000원
과제명 : 반도체광원시험생산기술지원
과제책임자 : 김왕기
MOCVD P-II
규격 및 수량 :
- 49x2“/18x3“ wafer capacity
- III-V compound based materials
- 적색 LED 구조의 에피성장 장비임
- In, Ga, Al, P 계 의 원료가스를 사용하여 InGaP, AlGaP, InGaAlP 등의 재료를 고온에서 증착하여 p-n 구조 형성에 활용
- 공정 중의 에피층 재성장에도 활용
① This equipment should be designed for growing
of InGaAlP LED structures.
② Contractor should provide the sample
demonstration on customer site.
① Water cooled double o-ring sealed stainless steel
growth chamber
② Capacity : More than 40 for 2“ or 18 for 3“ growth
per one run
③ In-situ monitoring viewports
④ Contractor specific heating system (up to at least 80
0℃)
⑤ Electronic MFCs for MO and hydride sources
⑥ Wafer carrier rotation system for uniformity of the
growth material
⑦ Reactor overpressure monitoring/protection system
① Real-time wafer selective reflectance measurement
② In-situ true wafer temperature measurement
① Glove box with purified Nitrogen gas flow
② Regeneration and recirculation system
③ Moisture level monitoring/alarming system
④ Integrated vacuum cleaner
① MO-source lines including: 2 TMGa, 2 TMAl,
2 TMIn, 1 Cp2Mg and additional spare lines
② Automatic run/vent pressure balancing line
적용가능 기판크기 : 2인치 wafer 49장
Reactor 형태 : Horizontal lamina flow
stainless steel reactor
Susceptor : Graphite susceptor
Heating : RF heating unit (100kw)
MO-source line : TMGa, TMAl, TMIn
Hydride line : AsH3, PH3
Dopant line : Si2H6, DTBSi, Cp2Mg
Glove box : Achievable gas purity 1 ppm H2O and O2
Rotation wafer : 7 satellite disk, 1 susceptor controlled with H2
Bath for MO source : TEMP Range (-20 ~ 50℃), over-temp. protection
안전시스템 : Interlock system, detector (CM4)
- 유독가스 감지시스템 : H2, AsH3, PH3